Download Flyer
PILATUS 300K detector
Unrivalled data quality for time resolved experiments

The PILATUS 300K detector system combines the high frame rate of a PILATUS 100K with the large area of 85 mm x 106 mm2. It is perfectly suited for all applications where you require a medium sized area detector combined with a high frame rate.

It is based on the newly developed CMOS hybrid-pixel technology and operates in single-photon-counting mode. It excels with its compact size, high frame rate and the outstanding capabilities which are common to all DECTRIS detector systems.

The PILATUS 300K detector system is air-cooled and therefore very simple in its operation and handling. It is ready to use and comes as a complete system with detector, PC with Linux OS and the data acquisition and analysis software TVX.


Applications:

  • Material science (MS)
  • X-ray diffraction (XRD)
  • Surface diffraction (SD)
  • Small-angle scattering (SAXS)
  • Time-resolved experiments
  • Non-destructive testing


Technical specifications

Number of modules 3 x 1
Sensor Reverse-biased silicon diode array
Sensor thickness 320 µm
Pixel size 172 x 172 µm2
Format 487 x 619 = 301,453 pixels
Area 83.8 x 106.5 mm2
Intermodule gap y: 17 pixels, 5.5% of total area
Dynamic range 20 bits (1:1,048,576)
Counting rate per pixel > 2 x 106 X-ray/s
Energy range 3 – 30 keV
Quantum efficiency
(calculated)
3 keV: 80%
8 keV: 99%
15 keV: 55%
Energy resolution 500 eV
Adjustable threshold range 2 – 20 keV
Threshold dispersion 50 eV
Readout time 3.6 ms
Framing rate 200 Hz
Point-spread function 1 pixel
Data formats Raw data, TIF, EDF, CBF
External trigger/gate 5V TTL, 3 different modes
Software interface Through socket connection; clients for EPICS, SPEC and stand-alone operation are available
Cooling Air-cooled
Power consumption 50 W
Dimensions (WHD) 160 x 194 x 289 mm
Weight Approx. 10 kg