Electron Microscopy

Advancements in electron optics and automation are among the key factors that have enabled Transmission Electron Microscopy (TEM) to achieve near-atomic and sub-atomic resolution in structural biology and materials science, respectively. However, the most demanding applications are always pushing technology to advance further; while electron sources are brighter and electromagnetic lenses are more stable and their aberrations corrected, there is still room for improvement in the detection part of the electron microscope.

We specialize in Hybrid Photon Counting technology and our noise-free EIGER X 1M detector already demonstrated close-to-ideal behaviour in detecting electrons between 40 and 120 kV, as illustrated in a success story.

DECTRIS Products for Transmission Electron Microscopy

To push the limits of electron detection further, DECTRIS designed a new ASIC (Application Specific Integrated Circuit). This new readout chip delivers a combination of features that open new possibilities in materials science TEM: up to 18 kHz readout speed and count rates up to 10 million electrons/pix/sec, enabled by DECTRIS patented instant retrigger technology.

Our first product, the DECTRIS QUADRO, is a direct electron detector suitable for the most demanding materials science applications requiring outstanding performances without compromises.


  • Electron diffraction
  • STEM
  • Strain mapping
  • Lorentz, magnetic mapping
  • Ptychography
  • In-Situ TEM
  • Dynamic TEM

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