DECTRIS Hybrid Photon Counting (HPC) detectors are the leading X-ray detectors at state-of-the-art synchrotron beamlines around the world. This leading technology is also available for laboratory applications for the best possible data quality.
One of HPC technology’s major benefits — the absence of readout noise and dark current — is particularly valuable when collecting data with a home source. Even the brightest X-ray sources in the laboratory are much weaker than at the synchrotron, requiring longer exposure times and resulting in weaker signals. Eliminating dark current and readout noise enables HPC detectors to achieve unsurpassed signal-to-noise ratios and outperform other laboratory detector technologies. HPC’s direct detection results in sharper and better resolved signals than scintillator-based detectors, allowing the full benefit of a finely focused beam and a better X-ray image.
DECTRIS HPC detectors feature the highest count rates and best count rate linearity. These capabilities achieve more accurate data even when working with the brightest laboratory sources and strongly diffracting samples.
Macromolecular crystallography determines the atomic structure of biological macromolecules (mostly proteins and DNA) and their complexes by diffracting X-rays through a crystal grown from the macromolecule under study. Read more
Chemical crystallography, also referred to as small-molecule crystallography, uses X-ray diffraction from single crystals to determine the three-dimensional structures of molecules. Read more
DECTRIS Hybrid Photon Counting (HPC) detectors are ideally suited to small-angle X-ray scattering (SAXS) laboratory instrumentation due to their high dynamic range, absence of readout noise and dark current, high sensitivity, and superior stability. Read more
X-ray Powder Diffraction
X-ray powder diffraction (XRPD) enables rapid and non-destructive analyses of multi-component materials. Component identification is performed by searching a database for a measured diffraction pattern. Read more
Residual Stress XRD
Mechanical failure of metals and ceramics is often caused by deformations in crystal structure (strain) or of phase transformation, which are induced by external stresses. These structural changes are preferably quantified using a non-destructive technique such as X-ray powder diffraction (XRPD). Read more
DECTRIS’ HPC-detectors feature extremely small strips or pixels and large active areas. This makes them ideal for collecting the high-resolution data over an energy range of several KeV in a single shot. Read more