X-ray powder diffraction (XRPD) enables rapid and non-destructive analyses of materials. A simple material identification can be performed by fingerprinting, using an algorithm that search-matches the measured pattern with the patterns deposited in a database. More challenging applications of XRPD include determination of unit cell parameters (indexing), structure determination, crystallinity and texture analyses, and thin-film characterization.
DECTRIS Hybrid Photon Counting (HPC) detectors have been successfully integrated into X-ray diffractometers by many OEM partners. These instruments are applied in a broad range of industrial and laboratory analyses such as high-throughput, in-field, residual stress, structure determination, and high-resolution reciprocal space mapping. In laboratory experiments, HPC detectors dramatically reduce measurement time without compromising data quality. Their outstanding data quality can even allow for unrestrained refinement in structure analysis with accuracy comparable to single-crystal data.
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