The combination of HPC-detectors and synchrotron beamlines opened up the way to spectroscopic experiments under the most challenging conditions: extremely short exposure times, sample heterogeneity, high background signal, limited absorbed dose and single-shot data collection.
Owing to their advanced features, DECTRIS detectors are successfully applied in a variety of X-ray spectroscopy techniques: X-ray Emission Spectroscopy (XES), Resonant X-ray Emission Spectroscopy (RXES), Resonant Inelastic X-ray Scattering (RIXS), X-ray Absorption Near Edge Structure (XANES), Extended X-ray Absorption Fine Structure (EXAFS), X-ray Photon Correlation Spectroscopy (XPCS), X-Ray Fluorescence Computed Tomography (XRF-CT) and X-ray Fluorescence Holography.
DECTRIS’ specific solutions extend this list to the applications with demanding requirements such as detection of low energy photons with an optional energy threshold of 1600 eV in plasma spectroscopy or limited space in a spectrometer.
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