Tue, 11.09.2018 - Fri, 14.09.2018
Residual stress is a multi-scale phenomenon that influences most of the physical properties of materials and surfaces. Although it mainly concerns industrial applications, it is also investigated in solid-state physics, life sciences and geology.
ECRS10 is a lively platform for researchers from industry and academia to exchange their views and recent advances on the experimental, theoretical or numerical tools used for residual stress determination.
Meet David Murer, product manager industry, and Dubravka Šišak Jung, application scientist materials science, at the DECTRIS booth and find out how HPC-detectors can help you measure better X-ray diffraction data.