Sun, 19.08.2018 - Fri, 24.08.2018

XRM 2018

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The International Conference for X-Ray Microscopy (XRM 2018) addresses the most recent advances in X-ray microscopy technology and their applications. Take the chance to talk to Stefan Brandstetter, Head of Product Management at DECTRIS, and Pascal Hofer, General Manager DECTRIS USA. Meet them at our booth to find out how the latest developments in Hybrid Photon Counting technology can help resolve your X-ray microscopy challenges.