Fast 4D STEM with ARINA Hybrid-Pixel Detector
4D STEM is one of the most exciting STEM techniques today, as it allows the extraction of a great deal of samples’ information by the analysis of local electron scattering. In our talk, we will present results obtained with DECTRIS' latest development, a new hybrid-pixel detector for fast 4D STEM experiments. Given the possibilities of exceptionally high frame rate and single electron counting, applications from virtual STEM imaging to crystal phase/orientation map are explored, and further experiments such as electron ptychography and strain mapping are discussed.
Join the discussion with Dr. Daniel Stroppa, Application Scientists EM, and Dr. Luca Piazza, Product Manager EM, and learn more about the latest developments in electron detection technology.
- Day: Monday, September 5
- Time: 12:45-13:30 p.m.
- Location: Room D