The PILATUS3 R CdTe series combines the advantages of noise-free single-photon counting with the benefits of direct detection of hard X-rays in large cadmium telluride (CdTe) sensors.

Direct detection in a hybrid pixel results in sharper signals and better spatial resolution compared to scintillator based detectors. CdTe provides close to 100% absorption efficiency for Mo, Ag, and In radiation. Combined with noise-free single-photon counting, this brings X-ray detection in the laboratory to a new level of sensitivity and accuracy.

X-ray sources in the laboratory, particularly for hard X-rays, are much weaker than at the synchrotron, thus requiring longer exposure times and resulting in weaker signals. Thanks to the absence of dark current and readout noise, PILATUS3 R detectors outperform all other technologies in the laboratory. Single-photon counting is free of all other sources of noise and inaccuracy intrinsic to charge-integrating CMOS detectors, such as reset noise and nonlinear charge response. Instead, fastest counting electronics powered by DECTRIS Instant Retrigger Technology® in combination with accurate count rate correction provide a wide linear range, fully compatible with all laboratory applications and advanced X-ray sources.

Challenging laboratory applications such as charge density studies and pair distribution function analysis rely on hard radiation and on data with outstanding signal-to-noise ratios. The PILATUS3 R CdTe detectors series offers a unique combination of high-efficiency direct detection with noise-free single-photon counting and is the best match for these requirements in the laboratory.



PILATUS3 R CdTe - Direct detection with large-area CdTe sensors for your laboratory


  • Quantum efficiency > 90% for Mo, Ag, and In
  • Direct detection for sharpest spatial resolution
  • No readout noise and no dark signal for highest accuracy
  • High dynamic range
  • Fluorescence background suppression
  • Highest count rates
  • Synchrotron-proven radiation hardness
  • Maintenance-free operation
  • High reliability: No failure-prone sealing or complex cooling below room temperature


  • Charge density analysis
  • Pair distribution function (PDF) analysis
  • High-resolution chemical crystallography
  • High-pressure/high-temperature XRD
  • Critical Dimension SAXS
  • Computed tomography (CT)
  • Non-destructive testing (NDT)