PILATUS3 R CdTe
The PILATUS3 R CdTe series combines the advantages of noise-free single-photon counting with the benefits of direct detection of hard X-rays in large cadmium telluride (CdTe) sensors.
Direct detection in a hybrid pixel results in sharper signals and better spatial resolution compared to scintillator based detectors. CdTe provides close to 100% absorption efficiency for Mo, Ag, and In radiation. Combined with noise-free single-photon counting, this brings X-ray detection in the laboratory to a new level of sensitivity and accuracy.
X-ray sources in the laboratory, particularly for hard X-rays, are much weaker than at the synchrotron, thus requiring longer exposure times and resulting in weaker signals. Thanks to the absence of dark current and readout noise, PILATUS3 R detectors outperform all other technologies in the laboratory. Single-photon counting is free of all other sources of noise and inaccuracy intrinsic to charge-integrating CMOS detectors, such as reset noise and nonlinear charge response. Instead, fastest counting electronics powered by DECTRIS Instant Retrigger Technology® in combination with accurate count rate correction provide a wide linear range, fully compatible with all laboratory applications and advanced X-ray sources.
Challenging laboratory applications such as charge density studies and pair distribution function analysis rely on hard radiation and on data with outstanding signal-to-noise ratios. The PILATUS3 R CdTe detectors series offers a unique combination of high-efficiency direct detection with noise-free single-photon counting and is the best match for these requirements in the laboratory.
- Quantum efficiency > 90% for Mo, Ag, and In
- Direct detection for sharpest spatial resolution
- No readout noise and no dark signal for highest accuracy
- High dynamic range
- Fluorescence background suppression
- Highest count rates
- Synchrotron-proven radiation hardness
- Maintenance-free operation
- High reliability: No failure-prone sealing or complex cooling below room temperature
- Charge density analysis
- Pair distribution function (PDF) analysis
- High-resolution chemical crystallography
- High-pressure/high-temperature XRD
- Critical Dimension SAXS
- Computed tomography (CT)
- Non-destructive testing (NDT)