EIGER2 R CdTe 1M-W is a wide-area photon-counting detector ideal for X-ray imaging and other applications where image quality is of highest importance. Its small pixel size and a direct converting cadmium-telluride sensor, a nearly ideal MTF and highest resolution are essential for applications such as micro or nano CT. True spectral imaging with two energy thresholds, zero electronic noise and frame rate up to 100 Hz enhance your imaging data and enable new fields of applications not reached with conventional X-ray detectors. Excellent temporal stability and a robust mechanical design round up your experience with this high quality product.
Material scientists looking for a solution to collect time-resolved, in situ or operando data can exploit over 2000 horizontal pixels to cover a wide 2θ or q-ranges in a single shot. Even at short exposure times, data quality is ensured with over 500 vertical pixels that contribute to the data statistics through azimuthal integration. Detector's tiny pixels with one-pixel wide point spread function guarantee the premium angular resolution. EIGER2 R CdTe 1M-W is a laboratory detector for high-energy powder X-ray diffraction, pair distribution function studies, and total scattering measurements.
|Number of detector modules (W x H)||
2 x 1
|Active area (W x H) [mm²]||
155.1 x 38.4
|Pixel size [µm²]||
75 x 75
|Total number of pixels||
2,068 x 512 = 1,058,816
|Gap width vertical / horizontal* [pixels]||
12 / -
|Maximum count rate [cps/mm²]||
9.8 x 10⁸
|Maximum frame rate [Hz]||
|Point-spread function [pixels]||1 (FWHM)|
|Cadmium-telluride sensor thickness [µm]||750|
|Data format||HDF5 / NeXus|
|Dimensions (W x H x D) [mm³]||192 x 92 x 277|
|Photon energy [keV]||Up to 100|
* Plus a 2-pixel vertical gap in each module.
All specifications are subject to change without notice.