DECTRIS - DECTRIS

25.05.2017

DECTRIS goes west

DECTRIS USA is approaching. We are preparing the setup and offices in Philadelphia. DECTRIS USA will support our customers on the American continent. Being in the same area the reaction times will be much shorter than before.

25.05.2017

New Head of Marketing Communications

With his strong experiences at different companies, Andreas Lechner joined the DECTRIS team to develop the marketing strategy for the future.

25.05.2017

New Head of Support & Commissioning

Pascal Hofer moves to Philadelphia and Sascha Grimm takes over his position as Head of Support & Commissioning. He joined DECTRIS 2016 as Support Engineer and developed his knowledge fast.

Success Stories

02.02.2017

Hitting new highs

In 2016, PILATUS and EIGER users determined more wonderful structures than ever before. In this compilation of your successes, we tip our hats.

31.01.2017

Electrons are the new photons

After succeeding in high-end synchrotron radiation detection, EIGER X has now been shown to count electrons, too. Experiments in collaboration with the MRC-LMB in Cambridge demonstrate that EIGER is the ideal counting detector for electrons.

26.01.2017

High on EIGER

Two structures of the human cannabinoid receptor CB1 have been solved with data from EIGER X 16M and PILATUS3 6M detectors.

Events

19.06.2017-26.06.2017

CCP4-APS Workshop

The course at Advanced Photon Source in Argonne, Illinois, USA, is intended mainly for graduate students, postdoctoral researchers and young scientists, along with commercial/industrial researchers in the area of structural biology from all over the globe.

25.06.2017-02.07.2017

ACA Summer Course of Small Molecule Crystallography

This course in Evanston, Illinois, USA, is directed towards single-crystal chemical crystallography and powder diffraction techniques, as applicable to small molecule studies.

26.06.2017-28.06.2017

PETRA IV Coherence Workshop

This workshop in Hamburg, Germany, intends to bring together experts from X-ray photon correlation spectroscopy (XPCS), coherent X-ray diffraction imaging (CXDI), X-ray ptychography, and X-ray cross-correlation analysis (XCCA).