DECTRIS ELA® electron-counting detector offers best-in-class performance in terms of detector noise, frame rate, and dynamic range. It can handle a probe current well over 100 pA, and it simultaneously captures weak and intense reflections to enable advanced diffraction and imaging studies. In addition, it allows for fast elemental mapping in one go, which is especially crucial when working with beam-sensitive materials.

ELA hybrid-pixel detector is specifically optimized for Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM).

Captures everything: thanks to its dead-time-free readout, ELA detector collects all the information your sample can deliver.
Fast: ELA detector’s high frame and count rates reduce experiment time significantly and allow for increased instrument throughput.
Easy: ELA detector’s Application Programming Interface (API) enables straightforward integration into any modern data pipeline or electron microscopy suite.

Detector Specifications*

Number of pixels (W x H)	1,028 x 512
Active area (W x H) [ mm² ]	77.1 x 38.4
Pixel size (W x H) [ µm² ]	75 x 75
Sensor material	Silicon (Si)
Energy range [ keV ]	30 - 200
Frame rate (max.) [ Hz ]	2,250 (16-bit); 4,500 (8-bit)
Frame rate (ROI, max.) [ Hz ]	9,000 (16-bit); 18,000 (8-bit)
Count rate (max.) [ el/s/pixel ]	10⁷
Detective Quantum Efficiency, DQE(0)	0.9 at 100 kV, 0.8 at 200 kV
Detector mounting	On-axis, post spectrometer

*All specifications are subject to change without notice.
All technical documentation is available here.

ELA Technical Documentation

Key Contact

Luca Piazza

Product Manager - Electron Microscopy

E. luca.piazza@dectris.com

Brochure

User manual

Simplon API Manual

ALBULA software

Integrated Solutions

Discover DECTRIS ELA® detector that is fully integrated into electron microscopy instruments.

Gatan Stela Camera

This is the only fully integrated hybrid-pixel electron detector with Gatan Microscopy Suite® (GMS) software for advanced electron diffraction studies.

Nion IRIS EEL spectrometer

This is the highest-energy-resolution spectrometer on the market, reaching an unprecedented energy resolution of 4 meV.

CEOS CEFID

CEOS CEFID is very attractive for Electron Energy Loss Spectroscopy (EELS) applications, as its small non-isochromaticity (NI), as well as its long-term stability and reliable reproducibility of optical alignments, guarantees an excellent energy resolution.

Case Study

In a joint publication in Ultramicroscopy, Nion and DECTRIS tested and characterized DECTRIS ELA® hybrid-pixel electron detector and its application potential.

Publication: Hybrid-pixel Direct Detector for Electron Energy Loss Spectroscopy, Ultramicroscopy Vol. 217, October 2020

Read the article

Techniques

Electron Energy Loss Spectroscopy (EELS)

Simultaneously record the Zero-Loss Peak (ZLP) and the core-loss features that are present in the spectrum with our radiation-hard, high-dynamic-range electron detectors.