This ultra-fast 4D STEM detector does not compromise on dynamic range or sensitivity.

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DECTRIS ARINA® retractable, electron-counting detector was specifically developed for 4D STEM applications. Featuring a new ASIC, it combines an extreme speed of up to 120,000 frames per second with a high dynamic range and noise-free readout, thus enabling high-quality data acquisition at the native speed of a conventional STEM measurement. Thanks to DECTRIS’ hybrid-pixel technology, ARINA can employ different sensor materials and perform optimally in the whole energy range of 30-300 keV.

DECTRIS ARINA fits the bill for a broad spectrum of 4D STEM applications with dwell times below 10 μs, from crystalline-phases and orientation mapping to ptychography - including flexible STEM images reconstruction with virtual detectors.

  • Fast and sensitive: Even at a frame rate of 120 kHz, DECTRIS ARINA can count every single electron—up to 10 pA/pixel.
  • Flexible: Featuring silicon (Si) or high-Z sensor materials, DECTRIS ARINA covers a wide range of energies, from 30 to 300 keV.
  • Empowering: Our team of like-minded scientists and engineers is here to help you get the most out of your setup.

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Detector Specifications*

Number of pixels (W x H)

192 x 192

Active area (W x H)




20 x 20

Pixel size (W x H)




100 x 100

Sensor material

Silicon (Si) or high-Z

Energy range




30 - 300

Frame rate (max.)





Count rate (max.)





Detective Quantum Efficiency, DQE(0)

at 80 keV -  0.82 | at 200 keV - 0.75 | at 300 keV - 0.75

Detector mounting


*All specifications are subject to change without notice.
All technical documentation is available here.

Key Contact

Luca Piazza
Product Manager - Electron Microscopy


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If you are interested in trying out a DECTRIS ARINA® hybrid-pixel electron detector in your experimental setup, contact us. 

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We are happy to answer any questions about us, our detectors, or the process of integrating our detectors into your experimental setup.

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