16. August 2019
M&M 2019: Live electron detector and TEM on DECTRIS booth
Photo (from left to right): Clemens Schulze-Briese, Sacha De Carlo, JEOL TEM with our QUADRO detector, Luca Piazza, Jovan Stankovic, Radosav Pantelic & Christian Brönnimann.
For the first time in DECTRIS’ history, we brought a fully functional detector to the show to demonstrate its performance and ease of use to the conference attendees and visitors from all around the world. The QUADRO detector (surrounded by blue LEDs in the above photo) was mounted on a JEOL Transmission Electron Microscope.
In addition to QUADRO, the audience was very curious about the two additional, bigger detectors that we introduced this year: ELA, a rectangular detector well suited for Electron Energy Loss Spectroscopy, and CRISTALLINA, a 1M general purpose detector for Electron Microscopy imaging and diffraction.
Two highlights worth mentioning from this year’s conference are the excellent performance of the ELA detector used in an EELS live demo by our partner and booth neighbor NION Company, and outstanding results in single-particles cryoEM obtained by Chris Russo’s research team at the MRC-LMB in Cambridge, U.K. Matthew Peet’s presentation illustrated the benefits of using an EIGER X 500K for cryoEM data collection at 100 kV (paper submitted).
We thank Hobie Richards and his collaborators from TSS Microscopy (Hillsboro, OR, U.S.), also an exhibitor at M&M, for the loan of the JEOL microscope and the excellent support before, during and after the show!