Electron Microscopy (EM) provides insight at all scales and modalities of Materials Science research: from discovering new materials and understanding their physical and chemical properties to innovating advanced processes and conducting product quality control. With DECTRIS’ hybrid-pixel direct electron detectors, you will collect more information from your sample—faster and without any fuss.
- Fast and accurate: with their fast and continuous readout, DECTRIS’ hybrid-pixel detectors enable precise data collection at low radiation dosages.
- Easy: these detectors integrate straightforwardly into any modern data pipeline or electron microscopy suite.
- Reliable: a dedicated team of DECTRIS field engineers will help you during integration and throughout the product’s life cycle.
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