Detectors / Electron Detectors  /  Electron Detectors for Materials Science

Materials Science

Get the most out of your samples with DECTRIS’ radiation-hard, hybrid-pixel electron detectors.

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Electron Microscopy (EM) provides insight at all scales and modalities of Materials Science research: from discovering new materials and understanding their physical and chemical properties to innovating advanced processes and conducting product quality control. With DECTRIS’ hybrid-pixel direct electron detectors, you will collect more information from your sample—faster and without any fuss.

  • Accurate: this technology offers single-electron counting and noise-free detection.
  • Fast: our detectors significantly reduce experiment time and increase instrument throughput.
  • Easy: our detectors integrate straightforwardly into any modern data pipeline or electron microscopy suite.
  • Reliable: a dedicated team of DECTRIS field engineers will help you during integration and throughout the product’s life cycle. 

Detectors

QUADRO

QUADRO

With its continuous readout and noise-free acquisition, DECTRIS QUADRO® detector brings microED and electron imaging techniques to a new level.

ELA

ELA

Fast, sensitive, and radiation-hard, DECTRIS ELA® electron-counting detector offers unmatched performance in EELS and 4D STEM.

Compare*

   ELA QUADRO
Number of pixels (W x H) 1,028 x 512 512 x 512
Pixel size (W x H) [µm²] 75 x 75 75 x 75
Frame rate (full-frame, max.) [Hz] 2,250 (16-bit); 4,500 (8-bit) 2,250 (16-bit); 4,500 (8-bit)
  View all specifications View all specifications

*All specifications are subject to change without notice.

Key Contact

Luca Piazza
Luca Piazza
Product Manager - Electron Microscopy

Techniques

Want to know more?

We are happy to answer any questions about us, our detectors, or the process of integrating our detectors into your experimental setup.

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Need a DECTRIS hybrid-pixel detector integrated into your analytical instrument? Just reach out to us!