Electron Microscopy (EM) provides insight at all scales and modalities of Materials Science research: from discovering new materials and understanding their physical and chemical properties to innovating advanced processes and conducting product quality control. With DECTRIS’ hybrid-pixel direct electron detectors, you will collect more information from your sample—faster and without any fuss.
- Accurate: this technology offers single-electron counting and noise-free detection.
- Fast: our detectors significantly reduce experiment time and increase instrument throughput.
- Easy: our detectors integrate straightforwardly into any modern data pipeline or electron microscopy suite.
- Reliable: a dedicated team of DECTRIS field engineers will help you during integration and throughout the product’s life cycle.
|Number of pixels (W x H)||1,028 x 512||192 x 192||512 x 512|
|Pixel size (W x H) [µm²]||75 x 75||100 x 100||75 x 75|
|Frame rate (max.) [Hz]||2,250 (16-bit); 4,500 (8-bit)||120,000||2,250 (16-bit); 4,500 (8-bit)|
|View all specifications||VIEW ALL SPECIFICATIONS||View all specifications|
*All specifications are subject to change without notice.
Want to know more?
We are happy to answer any questions about us, our detectors, or the process of integrating our detectors into your experimental setup.