Electron Microscopy (EM) provides insight at all scales and modalities of Materials Science research: from discovering new materials and understanding their physical and chemical properties to innovating advanced processes and conducting product quality control. With DECTRIS’ hybrid-pixel direct electron detectors, you will collect more information from your sample—faster and without any fuss.
- Accurate: this technology offers single-electron counting and noise-free detection.
- Fast: our detectors significantly reduce experiment time and increase instrument throughput.
- Easy: our detectors integrate straightforwardly into any modern data pipeline or electron microscopy suite.
- Reliable: a dedicated team of DECTRIS field engineers will help you during integration and throughout the product’s life cycle.
Compare*
ELA | QUADRO | |
Number of pixels (W x H) | 1,028 x 512 | 512 x 512 |
Pixel size (W x H) [µm²] | 75 x 75 | 75 x 75 |
Frame rate (max.) [Hz] | 2,250 (16-bit); 4,500 (8-bit) | 2,250 (16-bit); 4,500 (8-bit) |
View all specifications | View all specifications |
*All specifications are subject to change without notice.
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