Electron Microscopy (EM) provides insight at all scales and modalities of Materials Science research: from discovering new materials and understanding their physical and chemical properties to innovating advanced processes and conducting product quality control. With DECTRIS’ hybrid-pixel direct electron detectors, you will collect more information from your sample—faster and without any fuss.
- Accurate: this technology offers single-electron counting and noise-free detection.
- Fast: our detectors significantly reduce experiment time and increase instrument throughput.
- Easy: our detectors integrate straightforwardly into any modern data pipeline or electron microscopy suite.
- Reliable: a dedicated team of DECTRIS field engineers will help you during integration and throughout the product’s life cycle.
Detectors
ARINA
Even at a frame rate of 120 kHz, this ultra-fast 4D STEM detector does not compromise on dynamic range or sensitivity.
QUADRO
With its continuous readout and noise-free acquisition, DECTRIS QUADRO® detector brings microED and electron imaging techniques to a new level.
ELA
Fast, sensitive, and radiation-hard, DECTRIS ELA® electron-counting detector offers unmatched performance in EELS and 4D STEM.
Compare*
| ELA | ARINA | QUADRO | |
| Number of pixels (W x H) | 1,028 x 512 | 192 x 192 | 512 x 512 |
| Pixel size (W x H) [µm²] | 75 x 75 | 100 x 100 | 75 x 75 |
| Frame rate (max.) [Hz] | 2,250 (16-bit); 4,500 (8-bit) | 120,000 | 2,250 (16-bit); 4,500 (8-bit) |
| View all specifications | VIEW ALL SPECIFICATIONS | View all specifications |
*All specifications are subject to change without notice.
Key Contact
Techniques
Electron Energy Loss Spectroscopy (EELS)
Simultaneously record the Zero-Loss Peak (ZLP) and the core-loss features that are present in the spectrum with our radiation-hard, high-dynamic-range electron detectors.
Fast Elemental Mapping
Perform elemental mapping almost in real time, and with minimal radiation damage to your sample, using our extremely fast hybrid-pixel detectors.
Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM)
Collect 4D STEM data of the highest possible quality with our precise and reliable electron-counting detectors.
Micro-Electron Diffraction (microED)
Acquire high-quality microED data fast using direct electron detection, combined with the high dynamic range and radiation hardness of DECTRIS’ electron detectors.
Related News
Want to know more?
We are happy to answer any questions about us, our detectors, or the process of integrating our detectors into your experimental setup.
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Need a DECTRIS hybrid-pixel detector integrated into your analytical instrument? Just reach out to us!
