A 5-minute read
We are excited to share our new publication in collaboration with Excillum. Together, we have published the article Exploring Image Quality Improvements in High-Speed Dual Threshold Photon-Counting Micro-CT in the Journal of Nondestructive Evaluation. It describes how combining Excillum’s high-brightness MetalJet X-ray sources with DECTRIS high-speed and sensitive photon-counting detector technology enables fast, high-quality computed tomography (CT) for battery inspection in seconds.
The study shows how optimizing the position of the energy thresholds in DECTRIS photon-counting detectors can significantly improve micro-CT image quality in dynamic, at-line and in-line battery R&D and inspection. This allows defects like winding inaccuracies or particle contamination to be identified within seconds, bringing synchrotron-like performance to laboratory and production environments. Such capabilities are essential for advancing electric vehicle battery safety, quality and manufacturing efficiency.
Earlier this summer, we also published a joint white paper with Excillum, highlighting how MetalJet sources and DECTRIS CdTe detectors open new opportunities for high-energy diffraction and scattering experiments.
Together, these publications underline the strength of our partnership and our shared vision: bringing next-generation X-ray capabilities to researchers and industry.
For more information, contact:
Carlo Amato, Innovation Solutions Engineer
Spyridon Gkoumas, Lead Market Development Manager, Senior Regional Sales EMEA Manager