DECTRIS EIGER2® X/XE CdTe photon-counting detectors provide high quantum efficiency for hard X-ray energies up to 100 keV, with a spatial resolution of 75 µm. Their cadmium-telluride sensor, which is 750 µm thick, brings all the advantages of EIGER2 X-ray detectors to high-energy applications. A high frame rate up to 2,000 kHz; under 100 ns of effective dead time between exposures; and ideal counting statistics enabled by a sharp, single-pixel point-spread function guarantee outstanding performance and accurate data collection.

Furthermore, these beamline detectors offer two independent energy thresholds that will enable you to suppress fluorescence background (with the lower threshold) while measuring the contribution of higher harmonics (with the upper threshold).

EIGER2 X/XE CdTe detectors come in different geometries and performances, and with optional vacuum capability. DECTRIS’ dedicated Support and Commissioning team will help you minimize any downtime.

Fast: these detectors offer image frame rates up to 2 kHz, along with advanced gating/triggering capabilities.
More & better data: our detectors feature high quantum efficiency, two adjustable energy-discriminating thresholds, and a high count rate. There is no readout noise or dark current.
Reliable: these detectors feature extremely stable performance and radiation hard design. Delivery terms are guaranteed, thanks to streamlined industrial production and top-notch support over the product’s entire lifetime.

Detectors

Detector Specifications*

	EIGER2 XE CdTe 16M	EIGER2 XE CdTe 9M	EIGER2 X CdTe 16M	EIGER2 X CdTe 9M	EIGER2 X CdTe 4M	EIGER2 X CdTe 1M	EIGER2 X CdTe 500K	EIGER2 X CdTe 2M-W	EIGER2 X CdTe 1M-W
Active area (W x H) [ mm² ]	311.1 x 327.2	233.1 x 244.7	311.1 x 327.2	233.1 x 244.7	155.1 x 162.2	77.1 x 79.7	77.1 x 38.4	311.1 x 38.4	155.1 x 38.4
Pixel array (W x H)	4,148 x 4,362	3,108 x 3,262	4,148 x 4,362	3,108 x 3,262	2,068 x 2,162	1,028 x 1,062	1,028 x 512	4,148 x 512	2,068 x 512
Pixel size (W x H) [ µm² ]	75 x 75	75 x 75	75 x 75	75 x 75	75 x 75	75 x 75	75 x 75	75 x 75	75 x 75
Inter-module gap (Hor./Vert.) [ pixels ]	12 / 38	12 / 38	12 / 38	12 / 38	12 / 38	- / 38	- / -	12 / -	12 / -
Intra-module gap (Hor.) [ pixels ]	2	2	2	2	2	2	2	2	2
Count rate (max.) [ ph/s/pixel ]	10⁷	10⁷	10⁷	10⁷	10⁷	10⁷	10⁷	10⁷	10⁷
Energy range [ keV ]	8 - 100	8 - 100	8 - 100	8 - 100	8 - 100	8 - 100	8 - 100	8 - 100	8 - 100
Number of energy thresholds	2	2	2	2	2	2	2	2	2
Threshold range [ keV ]	4 - 80	4 - 80	4 - 80	4 - 80	4 - 80	4 - 80	4 - 80	4 - 80	4 - 80
Frame rate (max.)¹ [ Hz ]	700 (8-bit); 560 (16-bit)	700 (8-bit); 560 (16-bit)	280 (8-bit); 140 (16-bit)	490 (8-bit); 245 (16-bit)	1,120 (8-bit); 560 (16-bit)	4,500 (8-bit); 2,250 (16-bit)	4,500 (8-bit); 2,250 (16-bit)	2,250 (8-bit); 1,125 (16-bit)	4,500 (8-bit); 2,250 (16-bit)
Region of Interest (ROI) readout	Yes	Yes	Yes	Yes	Not applicable	Not applicable	Not applicable	Not applicable	Not applicable
Readout time	Continuous readout	Continuous readout	Continuous readout	Continuous readout	Continuous readout	Continuous readout	Continuous readout	Continuous readout	Continuous readout
External gating	Yes	Yes	Yes	Yes	Yes	Yes	Yes	Yes	Yes
Image bit depth [ bits ]	32	32	32	32	32	32	32	32	32
Sensor material	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)	Cadmium telluride (CdTe)
Sensor thickness [ µm ]	750	750	750	750	750	750	750	750	750
Point-spread function (FWHM) [ pixels ]	1	1	1	1	1	1	1	1	1
Vacuum compatibility	Not applicable	Not applicable	Not applicable	Not applicable	Optional	Optional	Optional	Optional	Optional
Dimensions (W x H x D) [ mm³ ]	400 x 430 x 500	340 x 370 x 500	400 x 430 x 500	340 x 370 x 500	235 x 237 x 372	114 x 133 x 242	114 x 92 x 242	348 x 92 x 277	192 x 92 x 277
Weight [ kg ]	55	41	55	41	15	4.7	3.7	9.7	5.8
Cooling method	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)	Water (Module) / Air (Electronics)
PDF	User documentation	User documentation	User documentation	User documentation	User documentation	User documentation	User documentation	User documentation	User documentation

¹ One frame (16 bits) per exposure, i.e. single-threshold or difference image.
²Effective dead time between exposures < 100 ns (max. loss of 1 count/pixel)

*All specifications are subject to change without notice.

Key Contact

Tilman Donath

Product Manager - High Energy

E. tilman.donath@dectris.com

Brochure - EIGER2 XE CdTe

Brochure - EIGER2 X CdTe

User Manual EIGER2

Release Notes

ALBULA software

REACH Information EIGER2

Case Study

In macromolecular crystallography (MX), the increase of X-ray energy beyond the conventional 10-15 keV range promises a lot of gains: it can improve the diffraction efficiency, delivering more and better data from fewer crystals. However, up until now, the only limiting factor was hardware.

Using an EIGER2 cadmium-telluride detector for the first time, Selina L.S. Storm, Danny Axford, and Robin L. Owen from the Diamond Light Source (DLS) showcase the benefits of higher X-ray energies for macromolecular crystallography.

Publication: Experimental evidence for the benefits of higher X-ray energies for macromolecular crystallography, IUCr-J, September, 2021

Read the article

https://doi.org/10.1107/S2052252521008423