DECTRIS EIGER2® X/XE CdTe photon-counting detectors provide high quantum efficiency for hard X-ray energies up to 100 keV, with a spatial resolution of 75 µm. Their cadmium-telluride sensor, which is 750 µm thick, brings all the advantages of EIGER2 X-ray detectors to high-energy applications. A high frame rate up to 2,000 kHz; under 100 ns of effective dead time between exposures; and ideal counting statistics enabled by a sharp, single-pixel point-spread function guarantee outstanding performance and accurate data collection.
Furthermore, these beamline detectors offer two independent energy thresholds that will enable you to suppress fluorescence background (with the lower threshold) while measuring the contribution of higher harmonics (with the upper threshold).
EIGER2 X/XE CdTe detectors come in different geometries and performances, and with optional vacuum capability. DECTRIS’ dedicated Support and Commissioning team will help you minimize any downtime.
- Fast: these detectors offer image frame rates up to 2 kHz, along with advanced gating/triggering capabilities.
- More & better data: our detectors feature high quantum efficiency, two adjustable energy-discriminating thresholds, and a high count rate. There is no readout noise or dark current.
- Reliable: these detectors feature extremely stable performance and radiation hard design. Delivery terms are guaranteed, thanks to streamlined industrial production and top-notch support over the product’s entire lifetime.
Detectors
EIGER2 XE CdTe 16M
Our top-of-the-line product, beeing the ultimate choice for high-energy applications at unlimited speed.
EIGER2 XE CdTe 9M
With a large active area and a continuous frame rate of up to 550 Hz, this is the perfect detector for high-throughput scanning, fast scanning or time-resolved measurements.
EIGER2 X CdTe 16M
This detector offers the larges active area of our EIGER2 seies with a resolution of more than 4k x 4k pixels - the perfect system for highest-quality X-Ray diffraction in a single shot.
EIGER2 X CdTe 9M
This detector combines a large active area, advanced external triggering, and gating capabilities. It is an excellent allrounder for synchrotron applications at high-energies.
EIGER2 X CdTe 4M
This detector provides wide-angle coverage with a high resolution for compact experimental setups.
EIGER2 X CdTe 1M
This detector offers excellent versatility for high-energy, in-situ X-ray research.
EIGER2 X CdTe 500K
Light and compact, this detector can fit into any high-energy experimental setup.
EIGER2 X CdTe 2M-W
Its wide geometry, combined with all the advantages of DECTRIS’ hybrid-pixel technology, make this detector the ideal X-ray detector for powder diffraction applications.
EIGER2 X CdTe 1M-W
This detector provides a unique combination of a CdTe sensor, superior sensitivity to X-rays above 20 keV, a wide geometry, and an excellent frame rate of up to 2,000 Hz. It is ideal for high-energy X-ray diffraction applications.
Detector Specifications*
| EIGER2 XE CdTe 16M | EIGER2 XE CdTe 9M | EIGER2 X CdTe 16M | EIGER2 X CdTe 9M | EIGER2 X CdTe 4M | EIGER2 X CdTe 1M | EIGER2 X CdTe 500K | EIGER2 X CdTe 2M-W | EIGER2 X CdTe 1M-W | |
|---|---|---|---|---|---|---|---|---|---|
|
Active area (W x H) [mm² ] |
311.1 x 327.2 |
233.1 x 244.7 |
311.1 x 327.2 |
233.1 x 244.7 |
155.1 x 162.2 |
77.1 x 79.7 |
77.1 x 38.4 |
311.1 x 38.4 |
155.1 x 38.4 |
|
Pixel array (W x H) |
4,148 x 4,362 |
3,108 x 3,262 |
4,148 x 4,362 |
3,108 x 3,262 |
2,068 x 2,162 |
1,028 x 1,062 |
1,028 x 512 |
4,148 x 512 |
2,068 x 512 |
|
Pixel size (W x H) [µm² ] |
75 x 75 |
75 x 75 |
75 x 75 |
75 x 75 |
75 x 75 |
75 x 75 |
75 x 75 |
75 x 75 |
75 x 75 |
|
Inter-module gap (Hor./Vert.) [pixels ] |
12 / 38 |
12 / 38 |
12 / 38 |
12 / 38 |
12 / 38 |
- / 38 |
- / - |
12 / - |
12 / - |
|
Intra-module gap (Hor.) [pixels ] |
2 |
2 |
2 |
2 |
2 |
2 |
2 |
2 |
2 |
|
Count rate (max.) [ph/s/pixel ] |
107 |
107 |
107 |
107 |
107 |
107 |
107 |
107 |
107 |
|
Energy range [keV ] |
8 - 100 |
8 - 100 |
8 - 100 |
8 - 100 |
8 - 100 |
8 - 100 |
8 - 100 |
8 - 100 |
8 - 100 |
|
Number of energy thresholds |
2 |
2 |
2 |
2 |
2 |
2 |
2 |
2 |
2 |
|
Threshold range [keV ] |
4 - 80 |
4 - 80 |
4 - 80 |
4 - 80 |
4 - 80 |
4 - 80 |
4 - 80 |
4 - 80 |
4 - 80 |
|
Frame rate (max.)1 [Hz ] |
700 (8-bit); |
700 (8-bit); |
280 (8-bit); |
490 (8-bit); |
1,120 (8-bit); |
4,500 (8-bit); |
4,500 (8-bit); |
2,250 (8-bit); |
4,500 (8-bit); |
|
Region of Interest (ROI) readout |
Yes |
Yes |
Yes |
Yes |
Not applicable |
Not applicable |
Not applicable |
Not applicable |
Not applicable |
|
Readout time2 |
Continuous readout |
Continuous readout |
Continuous readout |
Continuous readout |
Continuous readout |
Continuous readout |
Continuous readout |
Continuous readout |
Continuous readout |
|
External gating |
Yes |
Yes |
Yes |
Yes |
Yes |
Yes |
Yes |
Yes |
Yes |
|
Image bit depth [bits ] |
32 |
32 |
32 |
32 |
32 |
32 |
32 |
32 |
32 |
|
Sensor material |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
Cadmium telluride (CdTe) |
|
Sensor thickness [µm ] |
750 |
750 |
750 |
750 |
750 |
750 |
750 |
750 |
750 |
|
Point-spread function (FWHM) [pixels ] |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
1 |
|
Vacuum compatibility |
Not applicable |
Not applicable |
Not applicable |
Not applicable |
Optional |
Optional |
Optional |
Optional |
Optional |
|
Dimensions (W x H x D) [mm³ ] |
400 x 430 x 500 |
340 x 370 x 500 |
400 x 430 x 500 |
340 x 370 x 500 |
235 x 237 x 372 |
114 x 133 x 242 |
114 x 92 x 242 |
348 x 92 x 277 |
192 x 92 x 277 |
|
Weight [kg ] |
55 |
41 |
55 |
41 |
15 |
4.7 |
3.7 |
9.7 |
5.8 |
|
Cooling method |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
Water (Module) / Air (Electronics) |
|
|
1 One frame (16 bits) per exposure, i.e. single-threshold or difference image.
2 Effective dead time between exposures < 100 ns (max. loss of 1 count/pixel)
*All specifications are subject to change without notice.
Key Contact
Case Study
In macromolecular crystallography (MX), the increase of X-ray energy beyond the conventional 10-15 keV range promises a lot of gains: it can improve the diffraction efficiency, delivering more and better data from fewer crystals. However, up until now, the only limiting factor was hardware.
Using an EIGER2 cadmium-telluride detector for the first time, Selina L.S. Storm, Danny Axford, and Robin L. Owen from the Diamond Light Source (DLS) showcase the benefits of higher X-ray energies for macromolecular crystallography.
Publication: Experimental evidence for the benefits of higher X-ray energies for macromolecular crystallography, IUCr-J, September, 2021
https://doi.org/10.1107/S2052252521008423
Related News
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