EIGER2 X CdTe 4M

The EIGER2 X CdTe 4M system provides optimal efficiency for high-energy applications. Any experiment using energies above 20 keV will benefit from the great stopping power of the cadmium-telluride sensor. This X-ray detector is optimally suited for any diffraction technique: e.g. powder diffraction, SAXS, or high-pressure experiments. The external trigger input with a programmable delay function makes synchronization between the detector and other hardware extremely easy to achieve. Light and compact, this detector will fit perfectly into any experimental set-up. 

Specifications EIGER2 X CdTe 4M

Number of detector modules (W x H) 2 x 4
Active area (W x H) [mm²] 155.1 x 162.2
Pixel size [µm²] 75 x 75
Total number of pixels 2,068 x 2,162 = 4,471,016
Gap width vertical / horizontal [pixels]* 12 / 38
Energy-discriminating thresholds 2
Count-rate capability [photons/s/pixel] 10⁷
Maximum frame rate [Hz] 500
Point-spread function [pixels] 1 (FWHM)
Cadmium-telluride sensor thickness [µm] 750
Data format HDF5 / NeXus
Dimensions (W x H x D) [mm³] 235 x 237 x 372
Weight [kg] 15
Photon energy [keV] Up to 100

* Plus a 2-pixels vertical gap in each module.


All specifications are subject to change without notice.

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