With its large sensor area of 233 x 244 mm2, the EIGER2 XE CdTe 9M is the ideal X-ray detector for high-energy X-ray diffraction, diffuse scattering, powder diffraction, pair distribution function analysis, and other applications. It can operate continuously at frame rates of up to 550 Hz, which enables time-resolved and in situ experiments that are free of image lag. Noise-free single-photon counting and the direct-conversion sensor’s sharp point spread function allow weak signals next to strong peaks to be measured with the best possible signal-to-noise ratio, yielding highly detailed images.
Number of detector modules (W x H) | 3 x 6 |
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Active area (W x H) [mm²] | 233.1 x 244.7 |
Pixel size [µm²] | 75 x 75 |
Total number of pixels | 3,108 x 3,262 = 10,138,296 |
Gap width vertical / horizontal [pixels]* | 12 / 38 |
Energy-discriminating thresholds | 2 |
Count-rate capability [photons/s/pixel] | 10⁷ |
Maximum frame rate [Hz] | 550 |
Point-spread function [pixels] | 1 (FWHM) |
Cadmium-telluride sensor thickness [µm] | 750 |
Data format | HDF5 / NeXus |
Dimensions (W x H x D) [mm³] | 340 x 370 x 500 |
Weight [kg] | 41 |
Photon energy [keV] | Up to 100 |
* Plus a 2-pixel vertical gap in each module.
All specifications are subject to change without notice.