With its large sensor area of 233 x 244 mm2, the EIGER2 XE CdTe 9M is the ideal X-ray detector for high-energy X-ray diffraction, diffuse scattering, powder diffraction, pair distribution function analysis, and other applications. It can operate continuously at frame rates of up to 550 Hz, which enables time-resolved and in situ experiments that are free of image lag. Noise-free single-photon counting and the direct-conversion sensor’s sharp point spread function allow weak signals next to strong peaks to be measured with the best possible signal-to-noise ratio, yielding highly detailed images.

Specifications EIGER2 XE CdTe 9M
Number of detector modules (W x H) 3 x 6
Active area (W x H) [mm²] 233.1 x 244.7
Pixel size [µm²] 75 x 75
Total number of pixels 3,108 x 3,262 = 10,138,296
Gap width vertical / horizontal [pixels]* 12 / 38
Energy-discriminating thresholds 2
Count-rate capability [photons/s/pixel] 10⁷
Maximum frame rate [Hz] 550
Point-spread function [pixels] 1 (FWHM)
Cadmium-telluride sensor thickness [µm] 750
Data format HDF5 / NeXus
Dimensions (W x H x D) [mm³] 340 x 370 x 500
Weight [kg] 41
Photon energy [keV] Up to 100

* Plus a 2-pixel vertical gap in each module.

All specifications are subject to change without notice.


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