The EIGER2 X 4M is perfect for serial crystallography, ptychography or SAXS measurements. Its four million pixels offer sufficient spatial resolution for large unit cells, allow high-resolution ptychography measurements, and cover a large q-range for SAXS. Its optional vacuum capability makes the EIGER2 X 4M an universal tool - especially when large area and background reduction are essential.
| Number of detector modules (W x H) | 2 x 4 |
|---|---|
| Sensitive area (width x height) [mm²] | 155.1 x 162.2 |
| Pixel size [µm²] | 75 x 75 |
| Total number of pixels | 2068 x 2162 = 4,471,016 |
| Gap width vertical / horizontal [pixels] | 12 / 38 |
| Energy discriminating thresholds | 2 |
| Count-rate capability [photons/s/pixel] | 10⁷ |
| Point-spread function | 1 (FWHM) |
| Silicon Sensor thickness [µm] | 450 |
| Data format | HDF5 / NeXus |
| Vacuum compatibility (optional) | yes |
| Frame rate [Hz] | 500 |
| Energy range [keV] | 6.0 - 40 |
| Dimensions (W x H x D) [mm³] | 235 x 237 x 372 |
| Weight [kg] | 15 |
All specifications are subject to change without notice.