The EIGER2 X 4M is perfect for serial crystallography, ptychography or SAXS measurements. Its four million pixels offer sufficient spatial resolution for large unit cells, allow high-resolution ptychography measurements, and cover a large q-range for SAXS. Its optional vacuum capability makes the EIGER2 X 4M an universal tool - especially when large area and background reduction are essential.
|Number of detector modules (W x H)||2 x 4|
|Sensitive area (width x height) [mm²]||155.1 x 162.2|
|Pixel size [µm²]||75 x 75|
|Total number of pixels||2068 x 2162 = 4,471,016|
|Gap width vertical / horizontal [pixels]||12 / 38|
|Energy discriminating thresholds||2|
|Count rate capability [photons/s/pixel]||10⁷|
|Point-spread function||1 (FWHM)|
|Silicon Sensor thickness [µm]||450|
|Data format||HDF5 / NeXus|
|Vacuum compatibility (optional)||yes|
|Frame rate [Hz]||500|
|Energy range [keV]||6.0 - 40|
|Dimensions (W x H x D) [mm³]||235 x 237 x 372|
All specifications are subject to change without notice.