The EIGER2 X 4M is perfect for serial crystallography, ptychography or SAXS measurements. Its four million pixels offer sufficient spatial resolution for large unit cells, allow high-resolution ptychography measurements, and cover a large q-range for SAXS. Its optional vacuum capability makes the EIGER2 X 4M an universal tool - especially when large area and background reduction are essential.

Specifications EIGER2 X 4M

Number of detector modules (W x H) 2 x 4
Sensitive area (width x height) [mm²] 155.1 x 162.2
Pixel size [µm²] 75 x 75
Total number of pixels 2068 x 2162 = 4,471,016
Gap width vertical / horizontal [pixels] 12 / 38
Energy discriminating thresholds 2
Count-rate capability [photons/s/pixel] 10⁷
Point-spread function 1 (FWHM)
Silicon Sensor thickness [µm] 450
Data format HDF5 / NeXus
Vacuum compatibility (optional) yes
Frame rate [Hz] 500
Energy range [keV] 6.0 - 40
Dimensions (W x H x D) [mm³] 235 x 237 x 372
Weight [kg] 15


All specifications are subject to change without notice.


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