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Dive into the world of X-ray and electron detection with DECTRIS blog.

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Interviews
Electron microscopy // 20.09.2022

What does Ptychography bring to the table, and how can we benefit from it? 

Electron microscopy // 25.07.2022
Explore this interview with Benedikt Haas, the first DECTRIS ELA user!
Electron microscopy // 07.06.2022
Explore well-known and new facts about 4D STEM: from basic principles to the latest developments.
Electron microscopy // 08.05.2022
DECTRIS celebrates the 25th anniversary of the function of the first aberration-corrected TEM with a selection of papers.
Electron microscopy // 13.04.2022
In this interview, we talk with Colin Ophus about 4D STEM, detector technologies, and computational research.
Electron microscopy // 10.11.2021
Electron microscopy experts share their outlooks on hybrid-pixel technology and its impact on the field.
Electron microscopy // 04.10.2021
MicroED and standard Electron Diffraction (ED) techniques make similar use of the resolving power of electrons, but with unique differences.
Electron microscopy // 16.09.2021
Your quick guide to the history and the present of direct electron detectors.
Electron microscopy // 14.08.2020
NION puts DECTRIS’ hybrid-pixel detector to the test to push the boundaries of Electron Energy Loss Spectroscopy (EELS).
Electron microscopy // 03.07.2020
How can Hybrid Pixel Detectors help mainstream Electron Diffraction? ELDICO Scientific interviews Sacha De Carlo