Based on hybrid-pixel technology, QUADRO is the first direct electron detector to be released by DECTRIS. It incorporates our signature instant retrigger, continuous readout, and noise-free acquisition. Even at high count rate (up to 10 million el/s/pix), DECTRIS QUADRO® detector is able to count every single electron, and thus assures more accurate data collection.

Thanks to QUADRO’s exceptionally high dynamic range, your experimental setup will no longer require a beam stopper, and this will allow you to obtain uninterrupted diffraction patterns. This characteristic, combined with QUADRO detector’s speed and sensitivity, make it a game-changer for techniques such as Micro-Electron Diffraction (microED), electron imaging, strain imaging, and ptychography.

Efficient: QUADRO detector’s fast readout chip, combined with its silicon sensor material, provides the ideal Detective Quantum Efficiency (DQE)—even at low energies.
Radiation-hard: QUADRO detector doesn’t require a beam stopper, and this will allow you to collect all data without interference.
Easy: QUADRO detector is compatible with SerialEM. Its Application Programming Interface (API) enables straightforward integration into any microscopy application suite.

Detector Specifications*

Number of pixels (W x H)	512 x 512
Active area (W x H) [ mm² ]	38.4 x 38.4
Pixel size (W x H) [ µm² ]	75 x 75
Sensor material	Silicon (Si)
Energy range [ keV ]	30 - 200
Frame rate (max.) [ Hz ]	2,250 (16-bit); 4,500 (8-bit)
Frame rate (ROI, max.) [ Hz ]	9,000 (16-bit); 18,000 (8-bit)
Count rate (max.) [ el/s/pixel ]	10⁷
Detective Quantum Efficiency, DQE(0)	0.9 at 100 kV, 0.8 at 200 kV
Detector mounting	Bottom-mounted, on-axis

*All specifications are subject to change without notice.
All technical documentation is available here.

QUADRO Technical Documentation

Key Contact

Luca Piazza

Product Manager - Electron Microscopy

E. luca.piazza@dectris.com

Brochure

User manual

Simplon API manual

ALBULA software

Integrated Solutions

Discover DECTRIS QUADRO® detector that is fully integrated into electron microscopy instruments.

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TopSPIN Strain combines Precession Electron Diffraction (PED) with automated strain mapping and analysis of diffraction patterns by comparing unstrained and strained areas of the same crystalline sample.

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TESCAN TENSOR 4D STEM

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Case Study

In his study, Dr. Tim Gruene investigated the prospects of electron diffraction for rapid structure identification using a hybrid-pixel electron detector.

Publication: Rapid Structure Determination of Microcrystalline Molecular Compounds Using Electron Diffraction, Angewandte Chemie, October 2018

Read the article

Techniques

Micro-Electron Diffraction (microED)

Acquire high-quality microED data fast using direct electron detection, combined with the high dynamic range and radiation hardness of DECTRIS’ electron detectors.